Optimizing the Cryo-FIB Milling Pipeline for Cryo-ET

Authors

• EP Dobbs
• ZZ Chaudhry
• N Mizuno

Abstract

Cryo Focused Ion Beam (FIB) milling integrates high-resolution imaging with cryogenic sample preparation to extract precise lamellae essential for cellular cryo-electron tomography. This technique involves freezing the sample to very low temperatures and utilizing a focused ion beam to mill thin lamellae suitable for microscopy. A critical requirement for successful lamella extraction is ensuring that the cell is accurately centered within the grid squares, facilitating precise ion beam milling. To enhance the efficiency of this process, we have been developing and training a machine learning model capable of identifying the circular grid and pinpointing cells suitable for milling. The aim is to expedite the selection and preparation of samples for FIB milling, thereby accelerating the overall process.

Scientific Focus Area: Structural Biology

This page was last updated on Tuesday, August 6, 2024